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Editors
See all (29)yuya kajikawa
Tokyo Institute of Technology
Meguro , Japan
Specialty Chief Editor
Patent Analytics
chih-hung hsieh
College of Management, Yuan Ze University
Zhong-li, Taoyuan , Taiwan
Associate Editor
Patent Analytics
wonjoon kim
Korea Advanced Institute of Science and Technology
Daejeon , South Korea
Associate Editor
Patent Analytics
antonio messeni petruzzelli
Politecnico di Bari
Bari , Italy
Associate Editor
Patent Analytics
